Global SemiFab Solutions  
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EG 6000e

Global Solution for 300mm Production: EG6000e designed for Parametric Test Structures resulting in Fine-pitch probing

The EG6000e is designed for 300mm production which requires highly accurate parametric testing at increasingly lower current and voltage levels. The EG6000e has exceptional low electrical noise and fast settling for high-throughput measurements.

The EG6000e Features and Benefits

THE RESULTS:The system features provide a wide range of benefits for low noise testing.

Information

For more information on the GSS EG6000e, please contact:

info@gsfsolutions.com